HORIBA JOBIN YVON

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Japan
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HORIBA Japan
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Products
Diffraction Grating
(Sales: Only for the domestic market)
Monochromator / CCD detector
(Sales: Only for the domestic market)

As a leading participant in the optical equipment world, Jobin Yvon Inc. answers a wide range of user needs with its line of monochromators and CCD detectors. This equipment can be utilized in a variety of fields from quality control to production control and from measurement of plasma emission spectrum and image spectral to fluorescence spectrum.
ICP Optical Emission Spectrometer
The ICP Optical Emission Spectrometer is used in many common daily applications. For example, it is used in the analysis of materials such as iron and aluminum, measurements for environmental protection, and the analysis of water and foods. It is also used in the analysis of halogens, including chlorine, which conventional instruments cannot analyze.
Radio Frequency Glow Discharge Spectrometer
The GD-Profiler Series can achieve fast, thin-film surface analysis unattainable by the conventional glimmer-type glow discharge model, providing fast and easy measurement of the surface state of surface-treated materials.
Spectrofluorometer
(Sales: Only for the domestic market)

Jobin Yvon Inc. provides world's most sensitive Spectrofluorometer series: users are able to choose one suitable for their budget and various applications from different types of spectrofluorometers, for instance, the most sensitive modular type, the downsized type , or the fiber-optic type designed specially for skin-fluorescence measurement etc.. The modular instrument especially can encourage users to custom tailar a spectrofluorometer's performance to the work they need to accomlish. This modular spectrometer deliver not only stady state measurement system but also picosecond lifetime measuring system only adding frequency domain lifetime unit.
Fluorescence Lifetime Spectrometer
Spectroscopic Ellipsometer
The Jobin Yvon spectro-ellipsometer is a thin film parameter measuring device that is non-destructive and does not require preliminary processing. Utilization of the PEM system allows this same equipment to achieve high speed and high accuracy, something that was not possible with the rotational analyzer method. Through the use of Jobin Yvon flexible analysis technology, users are able to handle typically difficult analysis and meet the challenges of the next generation of ultra-thin film analysis.
Semiconductor and liquid cyrstal process monitors
(Sales: Only for the domestic market)

To improve the yield of recent etching/manufactured film processes, film thickness, trench depth, and plasma must be monitored on a real time basis and management and control of the etching/manufactured film process is required. Our DIGIFAMILY is driven by the high level measurement technology of Jobin Yvon Inc., based in the advanced optics country of France. This makes control of leading edge details and complicated thin film processes possible.
Cathodoluminescence Spectrophotometer
Driven by proprietary optical technology, HORIBA's cathodo luminescence MP series makes it possible to evaluate material in a microscopic area in an assortment of fields such as diamonds, semiconductors, ceramics, and organisms. Sub surface structure monitoring, wide-gap material application, as well as evaluation of liquid crystals, defects, and impurities are also possible.
Photoluminescence Spectrophotometer
The HORIBA photo luminescence (PL) system is another spectroscope system that has been developed. HORIBA offers numerous equipment groups such as microscopical PL and composition distribution evaluation equipment to meet a variety of user demands. PL equipment from HORIBA is painstakingly developed from spectrochemical analysis technology and experience honed over more than 20 years thereby providing confidence even when our equipment is used as a black box.
Raman Spectrophotometer
(Sales: Only for the domestic market)

Those investigating the purchase of Raman related products should access the information here. Sales information also appears in this section for viewing at any time.
Forensic Systems

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